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Approved For Release 2000/08/10 : CIA-RDP96-00792R000300020002-1 LN465-92 crystals have a granularity of less than 1000 angstrom, they are called microcrystalline. Won crystalline is only a short range ordered (recently close to inter atom), but still can retain several crystal properties. A major method of studying material structure is X-ray and other diffraction technology. Through the use of diffraction instrument methods, it is possible to automatically record the intensity of the diffraction and the 23 angle relationship (i is the inclusive angle of the X-rays and the surface of the object). WNicrocrystalline silicone has many peaks, and its peak position 2i (for a Cu taret) are 28.46, 47.3, 368.18,69.20, weg and (1005 silicon monocrystalline silicon peaks at 69.20. Microcrystalline silicon with (100) direction orientation peaks at 69.20, with a very wide spectrum of peaks. 50 60 70 TLLUSTRATION TWO: MONOCRYSTAL SILICON X-RAY DIFFRACTION SPECTRAL LINES We used monocrystalline silicon pieces as test objects or container walls. Prior to and after the experiment, we performed X-ray diffraction analysis of the silicon pieces. The spectral lines of the monocrystalline Silicon pieces prior to the experiment are shown in illustration two. After the experiment, of the 40 pieces of silicon processed, most still retained the spectral line monocrystalline structure shown in illustration two. However, there were three pieces from different experiments which had different X-ray diffraction spectral lines. The simple expression of these is shown in illustration three. 27 Approved For Release 2000/08/10 : CIA-RDP96-00792R000300020002-1